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Metrologic Accused Of Patent Infringement


Blackwood, New Jersey – Metrologic Instruments, Inc. (NASDAQ-NMS:MTLG), today announced that on May 10, 2006, PSC Scanning, Inc., a subsidiary of PSC Inc., filed a Complaint against Metrologic Instruments, Inc. in the United States District Court in Oregon. The essence of the claim is that Metrologic’s Stratos product line of bi-optic scanners infringes two PSC patents. The suit seeks equitable relief and damages. Metrologic strongly disputes these claims and intends to vigorously defend this action and its intellectual property.

As reported in our first quarter earnings press release on May 9, 2006, Metrologic continues to show dramatic revenue growth and is gaining market share as verified by independent research organizations, outpacing the industry at large. Our consistent ability to grow sales extends to many product lines across the globe, allowing us to make inroads into markets previously dominated by only one or two manufacturers.

Metrologic’s Stratos product fa

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 Helpful Patent Terms

Workflow

Definition:
Workflow diagrams are a formal way to identify procedural steps and the logic employed in a process used to complete a task or job. Workflow diagrams include each interim step and product(s).

Patent Infringement

Definition:
Unauthorized making, using, offering to sell, selling or importing into the United States any patented invention.

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